1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60

IMAGE imgs/statoptimization01.gif
IMAGE imgs/statoptimization02.gif IMAGE imgs/statoptimization05.gif IMAGE imgs/statoptimization07.gif

GENERATION

STATISTICAL

OFSYSTEMMOMENTS/

ERRORPROPAGATION

-

-

Derived from a multivariate Taylor series expansion of P = f(X1, X2, . . . . . . Xn)

Retaining the terms up tothird order, and assuming that thecomponent variables (process factors) areuncorrelated:

[!] 2 [!] S(X i)
[!] [!]

IMAGE imgs/statoptimization52.gif IMAGE imgs/statoptimization53.gif IMAGE imgs/statoptimization54.gif

[!] [!] [!]

[!] [!] [!]

[!] [!] [!]

[!]n

i = 1

[!]n

i = 1

[S(P)]2

m3(Xi)

IMAGE imgs/statoptimization49.gif

=

+

Where:

S(P)=Standard deviation of device parameter P S(Xi)=Standard deviation of process factor X µ3(Xi)=Third central moment of process factoi
r Xi

Neglecting the last term, the variance of device parameter P can bepartitioned into the variance due to each process factor:

[!] 2 S(X i)[!] [!]

IMAGE imgs/statoptimization55.gif

[!] [!] [!]

[S(P )]2
i

[!]

=

IMAGE imgs/statoptimization04.gif

Hosted by www.Geocities.ws

1