Answers For IInd Internal Exam for Avanthi IV CSE
1.Test generation for sequential circuuit combinations is--2power(m+n)---(d)
2.Test generation for combinational circuits-->Boolean Diference --(b)
3.Test generation for Sequential circuits--Sate Table Verification--(c)
4.Boolean Difference -- 6th property--0--(b)
5. h*dF/dh---test for s-a-0 in boolaen differnce--(a)
6.Sequential Circuit-->(d)
7.Homing Sequence Indentificies final state uniquely--(b)
8.trivial or homogenous--(c)
9.trivial ---(c)
10 transfer sequence gives shortest input from Si to Sj--(c)