I started my research carrier in August 1997 at Inter-University Consortium, Indore, India and since then working on investigation of various properties of nanostructured thin films and multilayers.
During PhD thesis, the motivation was to prepare 56Fe/57Fe superstructures for their application as a nuclear Bragg monochromator for 3rd generation synchrotron radiation sources. A number of deposition techniques e.g. pulsed laser ablation, electron beam deposition, LB films were employed for achieving the optimum properties and to meet the demands, I had designed and developed a dedicated ion-beam sputtering system.
Since 2002, I am working as a post doctoral fellow at Paul Scherrer Institut as a co-responsible for a time-of-flight neutron reflectometer called as AMOR. The main responsibility of the current job is to perform experiments with users from all over the world along with development of the instrument and perusal of own research. The major part of work carried out during the post doctoral research was investigation of atomic diffusion in chemically homogeneous thin film multilayers of iron based amorphous and nanocrystalline alloys and to study the effect of interface roughness on interlayer exchange coupling in Fe/Cr multilayers with polarized neutron reflectometry technique. A significant amount of work done for setting up time-of-flight and polarization option at reflectometer AMOR.
My research interests are to study the physics of nanostructured thin films and buried interfaces. The phenomenons which are of interest are atomic transport along interfaces, surface and interface correlations and study of microstructural and magnetic properties. The major techniques used for investigation are: Atomic force microscopy (AFM), Transmission electron microscopy (TEM), secondary ion mass spectroscopy (SIMS), X-ray diffraction and reflection (XRD, XRR), X-ray photoelectron spectroscopy (XPS), physical properties measurement system (PPMS), neutron reflectivity (NR), conversion electron M�ssbauer spectroscopy (CEMS) and nuclear resonant scattering of synchrotron radiation (NRS of SR).
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Instrumentation and computing
Also experience with instrumentation from the point of view to design, develop and optimize a device or instrument for optimal results. As mentioned above during PhD an ion beam sputtering system was designed and developed. During initial years of postdoctoral work, I was involved in set-up of time of flight (ToF) option at neutron reflectometer, AMOR). After setting up AMOR in ToF mode, the polarization-analysis option was installed after finding out optimal settings for magnetic fields, wavelength distribution and various other parameters. For carrying out in situ diffusion measurements, I have designed a two zone vacuum furnace which can be directly mounted at the AMOR sample stage. The furnace was manufactured by a commercial company. Further, a 3-point Si wafer device was designed and developed in house to apply uniaxial stress onto the sample. Such a device was required to get further in sight of self-diffusion mechanism in chemically homogeneous multilayers. I have also good computing skills and experience with commercial operating systems such as MS Windows, Linux, UNIX and Macintosh. I have working knowledge of FORTRAN and C++ languages, mainly for developing routines for data analysis. I have an extensive experience with commercial fitting software for reflectometry such as Parratt and Simulreflec and for M�ssbauer spectroscopy using NORMOS.
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Experience at neutron and synchrotron radiation sources
Intense neutron and synchrotron radiation sources provide opportunity for investigation of various phenomenons which may not be studied using laboratory sources. I have extensively used neutron sources: ILL (France) and SINQ (Switzerland) and synchrotron radiation sources: SPring-8 (Japan), ESRF(France) and ELETTRA(Italy) and for investigating various properties related to thin films and multilayers.
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