James Buckner, Barry L. Chin, and Jon Henri, �Prometrix RS35e Gauge Study in Five Two-Level Factors and One Three-Level Factor,� Chapter 2 in Statistical Case Studies for Industrial Process Improvement, edited by Veronica Czitrom and Patrick D. Spagon, published by the American Statistical Association and the Society for Industrial and Applied Mathematics, 1997.
James Buckner, Barry L. Chin, Todd P. Green, and Jon Henri, �Revelation of a Microbalance Warm-Up Effect,� Chapter 4 in Statistical Case Studies for Industrial Process Improvement, edited by Veronica Czitrom and Patrick D. Spagon, published by the American Statistical Association and the Society for Industrial and Applied Mathematics, 1997.
James Buckner, David J. Cammenga, and Ann Weber, �Elimination of TiN Peeling During Exposure to CVD Tungsten Deposition Process Using Designed Experiments,� Chapter 15 in Statistical Case Studies for Industrial Process Improvement, edited by Veronica Czitrom and Patrick D. Spagon, published by the American Statistical Association and the Society for Industrial and Applied Mathematics, 1997.
James Buckner, Richard Huang, Kenneth A. Monnig, Elliot K. Broadbent, Barry L. Chin, Jon Henri, Mark Sorrell, and Kevin Venor, �Modeling a Uniformity Bulls-Eye Inversion,� Chapter 16 in Statistical Case Studies for Industrial Process Improvement, edited by Veronica Czitrom and Patrick D. Spagon, published by the American Statistical Association and the Society for Industrial and Applied Mathematics, 1997.
James Buckner, �Chemical Kinetics as a Guide to Experimental Design,� Invited talk presented to the Quality and Productivity Conference of the American Statistical Association, Rochester, New York, 1993.
James Buckner, Genus 8720 200mm Tool Evaluation, SEMATECH Technology Transfer 92061168-XFR, 1992.
James Buckner, �Particle Reduction,� Chapter 6 of Genus 8720 Blanket Tungsten Process Equipment Improvement Program Final Report, SEMATECH Technology Transfer 91090700A-ENG, 1991.
James Buckner, �Process Characterization/Optimization,� Chapter 7 of Genus 8720 Blanket Tungsten Process Equipment Improvement Program Final Report, SEMATECH Technology Transfer 91090700A-ENG, 1991.
James Buckner, �Computerized Sheet Resistance Control,� Chapter 9 of Genus 8720 Blanket Tungsten Process Equipment Improvement Program Final Report, SEMATECH Technology Transfer 91090700A-ENG, 1991.
J. L. Buckner, D. J. Vitkavage, and E. A. Irene, �Ellipsometric and Rutherford backscattering characterization of low-energy hydrogen-, helium-, neon-, and argon-bombarded silicon,� J. Appl. Phys. 63(11):5288-94 (1988).
J. L. Buckner, D. J. Vitkavage, E. A. Irene, T. M. Mayer, �Optical Model for the Ellipsometric Characterization of Low-Energy Ion-Beam Damage in Single-Crystal Silicon,� J. Electrochem. Soc. 133(8):1729 (1986).
C. A. Herb, J. L. Buckner, J. R. Overton, �The Effect of Cross-Sectional Geometry on the Accuracy of the Fiber-Wetting Balance,� J. Colloid Interface Sci. 94:14 (1983).