International NAISO Symposium on Information Science Innovations in INTELLIGENT QUALITY MANAGEMENT AND   METROLOGY (IQMM'2001)
Symposium Topics (IQMM'2001)
  • Artificial Intelligence in Measurement Techniques
  • Intelligent Quality Assurance
  • Expert Knowledge in Quality Management
  • Interfaces of Measurement and Decision Making
  • Estimation of Measurement Uncertainty
  • Intelligent Product Specification and Verification
  • Computer Aided Evaluation of Measurement Results
  • Function Related Intelligent Measurements
  • Artificial Intelligence in Nano and Pico Metrology
  • Education and Training in Intelligent Measurement Technique
  • Intelligent Measurements in Difficult Environment
  • Distributed Systems for Quality Management
  • Intelligent Collection and Filtering of Measurement Data
  • Intelligent Outlier Detection
  • Traceability and Intelligent Calibration in Metrology


 

Symposium Chair (IQMM'2001)
Prof. P. Herbert Osanna
Vienna University of Technology 
Dept. of Interchangeable Manufacturing and Industrial Metrology
Karlsplatz 13 / 3113
A-1040 Vienna, Austria
Phone: +43-1-58801-31140
Fax: +43-1-58801-31196
E-mail: [email protected]
Important Dates:

Submission Deadline:
           June 30, 2000
Notification of Acceptance:
           September 30, 2000
Delivery of Full Papers
           November 30, 2000
ISI'2001 
          March 17-21, 2001

 

Symposium Vice-Chair (IQMM'2001)

Prof. Ken Stout, U.K.
E-mail: [email protected]

Prof. Albert Weckenmann, Germany
E-mail: [email protected]

Other ISI'2001 Symposia
  • Clinical Trials (CT'2001)
  • E-Business and Beyond (EBB'2001)
  • Intelligent Automated Manufacturing (IAM'2001)
  • Engineering of Natural and Artificial Intelligent Systems (ENAIS'2001)

 
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