International
NAISO Symposium on Information Science Innovations in
INTELLIGENT QUALITY MANAGEMENT AND
METROLOGY (IQMM'2001)
Symposium
Topics (IQMM'2001)
Artificial Intelligence in Measurement Techniques
Intelligent Quality Assurance
Expert Knowledge in Quality Management
Interfaces of Measurement and Decision Making
Estimation of Measurement Uncertainty
Intelligent Product Specification and Verification
Computer Aided Evaluation of Measurement Results
Function Related Intelligent Measurements
Artificial Intelligence in Nano and Pico Metrology
Education and Training in Intelligent Measurement
Technique
Intelligent Measurements in Difficult Environment
Distributed Systems for Quality Management
Intelligent Collection and Filtering of
Measurement Data
Intelligent Outlier Detection
Traceability and Intelligent Calibration in
Metrology
Symposium
Chair (IQMM'2001)
Prof.
P. Herbert Osanna Vienna University of Technology
Dept. of Interchangeable Manufacturing and Industrial
Metrology
Karlsplatz 13 / 3113
A-1040 Vienna, Austria
Phone: +43-1-58801-31140
Fax: +43-1-58801-31196
E-mail: [email protected]
Important
Dates:
Submission
Deadline:
June 30, 2000
Notification
of Acceptance:
September 30, 2000
Delivery
of Full Papers
November 30, 2000
ISI'2001
March 17-21, 2001