X-ray Absorption Fine Structure (XAFS) Spectroscopy is a powerful technique to probe the local structure around almost any specific element in periodic table (except the lightest). It gives information on average interatomic istances, number and chemical identities of near neighbors. With careful data analysis, the local structure can be probes up to 5-6  Angestrum around the absorbing central atom. The technique can be used for absorbing atoms in any aggregation state (solid, liquid or gas), in all kinds of environment: crystalline solids, glasses, amorphous phases, liquids and solutions. With optimal experimental conditions, XAFS studies can be made at trace levels (< 1000 ppm), which is useful e.g. for studies of metal complexes on surfaces, catalysis, metal sites in bioinorganic samples, etc.
    The X-ray source for XAFS measurements is synchrotron radiation, which covers all the wavelenghts of the electromagnetic spectrum with an intensity of about 100 times (or more) higher than the conventional X-ray tubes. Using a wiggler or an undulator in the ring increase the brilliance and intensity of the beam.
    The experimental procedure has been carefully explained here.
Links to XAFS Related Softwares
Synchrotron Facilities in the World
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