CAUSTOOBH KASHYAP BEZBORUAH 735 St Clair Ave, Apt 1606, Ph: 503.901.5719 (Cell); 503.223.9413 (H) Portland, OR 97205 caustoobh@yahoo.com DEVICE/ PRODUCT ENGINEER Strong background in semiconductor device physics and device characterization. Investigate product yield and reliability issues. Experience in semiconductor device manufacturing and product test. Familiar with 8" wafer fab tools and methodologies. Interacted across different engineering groups to improve product yield.Involved in the analysis of etest results and their association with process condition changes. Oversee parametric test operation in an 8" wafer fab using Keithley ATE; maintain tools, develop test programs and methodologies. Carry out bench tests with HP4155, HP4156 testers. Software Skills * Programming languages: C, VisualBasic * Environment: Windows, UNIX, Windows NT, DOS, Macintosh systems. * Packages: Keithley TestSoft and Autogen, RS/1, SAS, Mathematica, Matlab, Verilog, DataPower EDUCATION MS, Electrical Engineering, 1998 - 2000 Iowa State University, Ames, IA M.Sc., Physics (specialization Electronics), 1994 - 1996 University of Delhi, Delhi, India B.Sc., Physics, 1991 - 1994 University of Delhi, Delhi, India Training and Relevant Courses * Comprehensive Verilog Design and Synthesis; Sunburst Design, Ft Collins, CO. * Keithley S900NT Software Training; Keithley Instruments, Inc, Santa Clara, CA. * Semiconductor Characterization, Reliability and Failure Analysis; Arizona State University, Phoenix, AZ. * Seven Habits of Highly Effective People; LSI Logic, Colorado Springs, CO. * In House Training programs on wafer fabrication and process technology. * University courses in Semiconductor Device Design and Analysis; Fabrication & Characterization of Semiconductor Devices; Physics of Semiconductors; MOS Devices and Digital Circuits; VLSI: Basic Layout and Design; Biomaterials; Scanning Electron Microscopy and Auger Spectroscopy; Advanced Electromagnetic Field Theory; Statistical Design and Analysis of Experiments. PROFESSIONAL EXPERIENCE LSI LOGIC CORPORATION, Gresham, OR 2001 - present Product/ Test Engineer Responsible for yield related issues at wafer sort and final test ASIC parts.Interacted with Process Engineering and Design on improving yields for prototypes and new technologies. * Involved with test program debugging on Credence testers for wafer sort. Worked on development of a new software to identify test program bugs. * Characterized skew lots across voltage, process and temperature with the objective of understanding yield variations. LSI LOGIC CORPORATION, Colorado Springs, CO 2000 - 2001 Device/ Etest Engineer Responsible for maintaining and supporting the parametric test equipment and test systems inline and end of line. * Installed and qualified new parametric test equipment, operating platforms and test programs. * Analyzed and interpreted etest data to disposition material that do not meet specifications. * Interacted with other process or product engineering groups on projects to improve or enhance the CMOS fabrication process. * Reduced defect density, in line scrap and parametric test variation by performing electrical analysis. * Carried tool correlations to support failure analysis and yield improvement. * Improved machine reliability and data accessibility by installing new software and drivers on existing machines. IOWA STATE UNIVERSITY, Ames, IA 1999 - 2000 Research Assistant Responsible for the fabrication and characterization of amorphous Si based photovoltaic films and devices (a - Si, SiGe) under Prof. V Dalal at the Microelectronics Research Center, Iowa State University. IOWA STATE UNIVERSITY, Ames, IA 1998 - 1999 Teaching Assistant Instructed undergraduate physics laboratories and recitation classes for a period of three semesters. UNIVERSITY OF DELHI, Delhi, India 1996 - 1998 Junior Research Fellow Conducted research on detecting and analyzing ultra heavy nuclei in galactic cosmic rays using solid-state track detectors; and presented results at he National Space Sciences Symposium, 1997 and Young Astronomers' Meet, 1998.